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A TRL Error-box Split Procedure to Compensate for the Bias Dependency Effects in Device TestFixtures
Performing Accurate Wafer level Trl Calibration Using Wincal | FormFactor
X11664A Short offsetshort line TRL Cal procedure
The Evolution of ARFTG
ARFTG94 B4 - An interlaboratory study of the reproducibility of on-wafer S parameter measurements
MPI AST - On-wafer calibration for accurate mm-wave characterization of advanced silicon device
Adaptor Extraction (Type-A) and De-Embedding Methods
Technical Trends in ARFTG's History
ARFTG94 A1 - EM Simulation and Validation Challenges for 5G Systems (Invited Paper)
VNA calibration using cal kit vs PCB (2 Solutions!!)
Non-Contact Characterization of Antenna Parameters via One-Port Open-Fixture Network Calibration
A prescription for On-Wafer Millimeter-Wave and THz Transistor Characterization
